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9783319330853

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Vincent S. Smentkowski is a Senior Scientist in the Nanostructures and Surfaces Laboratory at General Electric Global Research (GEGR) where he performs surface analysis to support research programs at GEGR, GE businesses, and strategic partners. Currently, his research is focused on the applications of ToF-SIMS analysis, emphasizing how multivariate statistical analysis tools facilitate data reduction. Vin holds 6 U.S. patents, more than 85 publications in referred journals, greater than 100 GEGR internal manuscripts, has co-authored 3 book chapters, and has presented numerous contributed and invited talks. Vin is a Fellow of the American Vacuum Society.  

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