Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings
Author:   Dit-Yan Yeung ,  James T. Kwok ,  Ana Fred ,  Fabio Roli
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   2006 ed.
Volume:   4109
ISBN:  

9783540372363


Pages:   939
Publication Date:   03 August 2006
Format:   Paperback
Availability:   Out of stock   Availability explained
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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshops, SSPR 2006 and SPR 2006, Hong Kong, China, August 17-19, 2006, Proceedings


Overview

This is the proceedings of the 11th International Workshop on Structural and Syntactic Pattern Recognition, SSPR 2006 and the 6th International Workshop on Statistical Techniques in Pattern Recognition, SPR 2006, held in Hong Kong, August 2006 alongside the Conference on Pattern Recognition, ICPR 2006. 38 revised full papers and 61 revised poster papers are included, together with 4 invited papers covering image analysis, character recognition, bayesian networks, graph-based methods and more.

Full Product Details

Author:   Dit-Yan Yeung ,  James T. Kwok ,  Ana Fred ,  Fabio Roli
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2006 ed.
Volume:   4109
Dimensions:   Width: 15.50cm , Height: 4.80cm , Length: 23.50cm
Weight:   1.454kg
ISBN:  

9783540372363


ISBN 10:   3540372369
Pages:   939
Publication Date:   03 August 2006
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Invited Talks.- SSPR.- Poster Papers.- SPR.- Poster Papers.

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Author Information

Tab Content 6

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NOV RG 20252

 

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