Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings

Author:   Antonio Robles-Kelly ,  Marco Loog ,  Battista Biggio ,  Francisco Escolano
Publisher:   Springer International Publishing AG
Edition:   1st ed. 2016
Volume:   10029
ISBN:  

9783319490540


Pages:   588
Publication Date:   05 November 2016
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2016, Mérida, Mexico, November 29 - December 2, 2016, Proceedings


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Overview

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural Syntactic, and Statistical Pattern Recognition, S+SSPR 2016, consisting of the International Workshop on Structural and Syntactic Pattern Recognition SSPR, and the International Workshop on Statistical Techniques in Pattern Recognition, SPR. The 51 full papers presented were carefully reviewed and selected from 68 submissions. They are organized in the following topical sections: dimensionality reduction, manifold learning and embedding methods; dissimilarity representations; graph-theoretic methods; model selection, classification and clustering; semi and fully supervised learning methods; shape analysis; spatio-temporal pattern recognition; structural matching; text and document analysis. 

Full Product Details

Author:   Antonio Robles-Kelly ,  Marco Loog ,  Battista Biggio ,  Francisco Escolano
Publisher:   Springer International Publishing AG
Imprint:   Springer International Publishing AG
Edition:   1st ed. 2016
Volume:   10029
Dimensions:   Width: 15.50cm , Height: 3.10cm , Length: 23.50cm
Weight:   9.007kg
ISBN:  

9783319490540


ISBN 10:   3319490540
Pages:   588
Publication Date:   05 November 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Dimensionality reduction.- Manifold learning and embedding methods.-Dissimilarity representations.- Graph-theoretic methods.- Model selection, classification and clustering.- Semi and fully supervised learning methods.- Shape analysis.- Spatio-temporal pattern recognition.- Structural matching.- Text and document analysis. 

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