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OverviewFull Product DetailsAuthor: V. Hauk (Institut für Werkstoffkunde, Rheinisch-Westfälische Technische Hochschule Aachen, Aachen, Germany)Publisher: Elsevier Science & Technology Imprint: Elsevier Science Ltd Dimensions: Width: 15.60cm , Height: 3.80cm , Length: 23.00cm Weight: 1.370kg ISBN: 9780444824769ISBN 10: 0444824766 Pages: 640 Publication Date: 10 November 1997 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Out of Print Availability: In Print ![]() Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock. Table of Contents1. Introduction 2. X-ray diffraction (V. Hauk, H. Behnken, W. Reimers, W. Pfeiffer, Ch. Genzel) 3. Neutron diffraction methods (L. Pintschovius) 4. Ultrasonic techniques (E. Schneider) 5. Micromagnetic techniques (W.A. Theiner) 6. Assessment of residual stresses (B. Scholtes)ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |