Stress-induced Phenomena in Metallization: Third International Workshop
Author:   P. S. Ho ,  John Bravman ,  Che-Yu Li (Cornell University) ,  John Sanchez
Publisher:   American Institute of Physics
Volume:   v. 373
ISBN:  

9781563964398


Pages:   320
Publication Date:   15 April 1998
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Our Price $369.60 Quantity:  
Add to Cart

Share |

Stress-induced Phenomena in Metallization: Third International Workshop


Add your own review!

Overview

This text is aimed at engineers and research scientists working in the fields of microelectronics and ma terials science. '

Full Product Details

Author:   P. S. Ho ,  John Bravman ,  Che-Yu Li (Cornell University) ,  John Sanchez
Publisher:   American Institute of Physics
Imprint:   American Institute of Physics
Volume:   v. 373
Dimensions:   Width: 16.70cm , Height: 2.20cm , Length: 24.00cm
Weight:   0.620kg
ISBN:  

9781563964398


ISBN 10:   1563964392
Pages:   320
Publication Date:   15 April 1998
Audience:   College/higher education ,  Professional and scholarly ,  General/trade ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

MRG2025CC

 

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now