Stress-Induced Phenomena in Metallization: Eighth International Workshop on Stress-induced Phenomena in Metallization
Author:   Ehrenfried Zschech ,  Karen Maex ,  P. S. Ho ,  Hisao Kawasaki
Publisher:   American Institute of Physics
Edition:   2006 ed.
Volume:   v. 817
ISBN:  

9780735403109


Pages:   383
Publication Date:   01 February 2006
Format:   Hardback
Availability:   Out of stock   Availability explained
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Stress-Induced Phenomena in Metallization: Eighth International Workshop on Stress-induced Phenomena in Metallization


Overview

These proceedings present current research on issues related to stress-induced phenomena in on-chip metal interconnects and solder joints. This volume will appeal to scientists, engineers, graduate students interested in research and development of microelectronic devices as well as technology integration, and semiconductor industry professionals and equipment suppliers.

Full Product Details

Author:   Ehrenfried Zschech ,  Karen Maex ,  P. S. Ho ,  Hisao Kawasaki
Publisher:   American Institute of Physics
Imprint:   American Institute of Physics
Edition:   2006 ed.
Volume:   v. 817
Dimensions:   Width: 15.50cm , Height: 2.50cm , Length: 23.50cm
Weight:   0.742kg
ISBN:  

9780735403109


ISBN 10:   0735403104
Pages:   383
Publication Date:   01 February 2006
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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