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OverviewFull Product DetailsAuthor: Liu Chu (ShanghaiTech University, China)Publisher: John Wiley & Sons Inc Imprint: Wiley-IEEE Press ISBN: 9781394352944ISBN 10: 1394352948 Pages: 304 Publication Date: 22 February 2026 Audience: Professional and scholarly , College/higher education , Professional & Vocational , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Forthcoming Availability: Awaiting stock Table of ContentsChapter 1. Overview Chapter 2. Electronic packaging Chapter 3. Random Sampling Methods Chapter 4. Random Fields and Stochastic Processes Chapter 5. Reliability Prediction Chapter 6. Finite element method Chapter 7. Nonlinear Stochastic finite element method Chapter 8. Random shear stress and thermal temperature Chapter 9. Material uncertainty in electro-migration Chapter 10. Mechanical reliability in the replaceable integrated chiplet assembly Chapter 11. Kriging Surrogate Model Chapter 12. Digital twins based on SFEMReviewsAuthor InformationLiu Chu, PhD, is a Senior Researcher in the School of Physical Science and Technology at ShanghaiTech University. Her research is primarily focused on uncertainty quantification in stochastic defects, numerical simulations for electronic packaging, and the development of advanced computational mechanics methods. Tab Content 6Author Website:Countries AvailableAll regions |
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