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OverviewFull Product DetailsAuthor: Dato N. M. de Gruijter , Leo J. Th. van der KampPublisher: Taylor & Francis Ltd Imprint: Chapman & Hall/CRC Weight: 0.453kg ISBN: 9780367388676ISBN 10: 0367388677 Pages: 280 Publication Date: 05 September 2019 Audience: College/higher education , General/trade , Tertiary & Higher Education , General Format: Paperback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsPreface. Measurement and Scaling. Classical Test Theory. Classical Test Theory and Reliability. Estimating Reliability. Generalizability Theory. Models for Dichotomous Items. Validity and Validation of Tests. Principal Component Analysis, Factor Analysis, and Structural Equation Modeling: A Very Brief Introduction. Item Response Models. Applications of Item Response Theory. Test Equating. Answers. References. Index.ReviewsAuthor Informationde Gruijter, Dato N. M.; van der Kamp, Leo J. Th. Tab Content 6Author Website:Countries AvailableAll regions |