Statistical Reliability Engineering: Methods, Models and Applications

Author:   Hoang Pham
Publisher:   Springer Nature Switzerland AG
Edition:   1st ed. 2022
ISBN:  

9783030769031


Pages:   497
Publication Date:   15 August 2021
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Statistical Reliability Engineering: Methods, Models and Applications


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Author:   Hoang Pham
Publisher:   Springer Nature Switzerland AG
Imprint:   Springer Nature Switzerland AG
Edition:   1st ed. 2022
Weight:   0.939kg
ISBN:  

9783030769031


ISBN 10:   3030769038
Pages:   497
Publication Date:   15 August 2021
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Probability, Statistics, and Reliability Concepts.- Distribution Functions and Its Applications.- Statistical Parameter Estimation.- System Reliability Modeling.- Order Statistics and Reliability Estimation.- Stochastic Processes.- Maintenance Modeling.- Software Reliability.- Statistical Machine Learning Methods and Its Applications.

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Author Information

Dr. Hoang Pham is Distinguished Professor and former Chairman (2007-2013) of the Department of Industrial and Systems Engineering at Rutgers University, New Jersey. Before joining Rutgers, he was Senior Engineering Specialist with the Boeing Company and the Idaho National Engineering Laboratory. He has been served as Editor-in-Chief, Editor, Associate Editor, Guest Editor and Board Member of many journals. He is Editor of Springer Book Series in Reliability Engineering and has served as Conference Chair and Program Chair of over 40 international conferences. He is the author or coauthor of 8 books and has published over 200 journal articles, 100 conference papers and edited 17 books including Springer Handbook in Engineering Statistics and Handbook in Reliability Engineering. He has delivered over 40 invited keynote and plenary speeches at many international conferences and institutions. His numerous awards include the 2009 IEEE Reliability Society Engineer of theYear Award. He is Fellow of the Institute of Electrical and Electronics Engineers (IEEE) and the Institute of Industrial Engineers (IIE).

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