Overview
Statistical pattern recognition relates to the use of statistical techniques for analysing data measurements in order to extract information and make justified decisions. It is a very active area of study and research, which has seen many advances in recent years. Applications such as data mining, web searching, multimedia data retrieval, face recognition, and cursive handwriting recognition, all require robust and efficient pattern recognition techniques. This third edition provides an introduction to statistical pattern theory and techniques, with material drawn from a wide range of fields, including the areas of engineering, statistics, computer science and the social sciences. The book has been updated to cover new methods and applications, and includes a wide range of techniques such as Bayesian methods, neural networks, support vector machines, feature selection and feature reduction techniques.Technical descriptions and motivations are provided, and the techniques are illustrated using real examples. Statistical Pattern Recognition, 3rd Edition: Provides a self-contained introduction to statistical pattern recognition. Includes new material presenting the analysis of complex networks. Introduces readers to methods for Bayesian density estimation. Presents descriptions of new applications in biometrics, security, finance and condition monitoring. Provides descriptions and guidance for implementing techniques, which will be invaluable to software engineers and developers seeking to develop real applications Describes mathematically the range of statistical pattern recognition techniques. Presents a variety of exercises including more extensive computer projects. The in-depth technical descriptions make the book suitable for senior undergraduate and graduate students in statistics, computer science and engineering. Statistical Pattern Recognition is also an excellent reference source for technical professionals. Chapters have been arranged to facilitate implementation of the techniques by software engineers and developers in non-statistical engineering fields. http://www.wiley.com/go/statistical_pattern_recognition
Full Product Details
Author: Andrew R. Webb (QinetiQ Ltd) ,
Keith D. Copsey (QinetiQ Ltd) ,
Gavin Cawley
Publisher: John Wiley & Sons Inc
Imprint: John Wiley & Sons Inc
Edition: 3rd edition
Dimensions:
Width: 17.50cm
, Height: 4.10cm
, Length: 24.90cm
Weight: 1.225kg
ISBN: 9780470682272
ISBN 10: 0470682272
Pages: 672
Publication Date: 21 October 2011
Audience:
Professional and scholarly
,
Professional & Vocational
Format: Hardback
Publisher's Status: Active
Availability: Out of stock
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.
Reviews
In the end I must add that this book is so appealing that I often found myself lost in the reading, pausing the overview of the manuscript in order to look more into some presented subject, and not being able to continue until I had finished seeing all about it. ( Zentralblatt MATH , 1 December 2012)
In the end I must add that this book is so appealing thatI often found myself lost in the reading, pausing the overview ofthe manuscript in order to look more into some presented subject,and not being able to continue until I had finished seeing allabout it. (Zentralblatt MATH, 1 December2012)
Author Information
Dr Andrew Robert Webb, Senior Researcher, QinetiQ Ltd, Malvern, UK. Dr Keith Derek Copsey, Senior Researcher, QinetiQ Ltd, Malvern, UK.
