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OverviewFull Product DetailsAuthor: Gerald J. Hahn (Research and Development Center, General Electric Company, Niskayuna, NY) , Samuel S. Shapiro (Research and Development Center, General Electric Company, Niskayuna, NY)Publisher: John Wiley & Sons Inc Imprint: Wiley-Interscience Edition: New edition Dimensions: Width: 15.30cm , Height: 1.80cm , Length: 22.90cm Weight: 0.447kg ISBN: 9780471040651ISBN 10: 0471040657 Pages: 376 Publication Date: 09 May 1994 Audience: Professional and scholarly , Professional & Vocational Format: Paperback Publisher's Status: Active Availability: Out of stock ![]() The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available. Table of ContentsReviewsAuthor InformationGerald J. Hahn, PhD, worked at the GE Global Research Center for 46 years, where he managed its statistics group for 28 years and was elected a Coolidge Fellow, the organization's highest honor, in 1984. A Fellow of the American Statistical Association and American Society for Quality, Dr. Hahn is the author of numerous papers and the coauthor of Statistical Models in Engineering; Statistical Intervals: A Guide for Practitioners; and The Role of Statistics in Business and Industry, all published by Wiley. He has received many professional awards and served as adjunct professor at various universities. William Q. Meeker, PhD, is a Professor of Statistics and Distinguished Professor of Liberal Arts and Sciences at Iowa State University. He is a Fellow of the American Statistical Association and the American Society for Quality and a past Editor of Technometrics. He is co-author of the books Statistical Methods for Reliability Data with Luis Escobar, and Statistical Intervals: A Guide for Practitioners with Gerald Hahn. Tab Content 6Author Website:Countries AvailableAll regions |