Statistical Methods for SPC and TQM

Author:   D Bissell ,  Chris Chatfield (University of Bath, UK) ,  Jim Zidek (University of British Columbia, Vancouver, Canada) ,  Jim Lindsey (University of Liege, Liege, Belgium)
Publisher:   Taylor & Francis Ltd
Volume:   26
ISBN:  

9780412394409


Pages:   384
Publication Date:   15 May 1994
Format:   Hardback
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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Statistical Methods for SPC and TQM


Overview

Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices. Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered. Contents Data Collection and Graphical Summaries Numerical Data Summaries-Location and Dispersion Probability and Distribution Sampling, Estimation, and Confidence Sample Tests of Hypothesis; ""Significance Tests"" Control Charts for Process Management and Improvement Control Charts for Average and Variation Control Charts for ""Single-Valued"" Observations Control Charts for Attributes and Events Control Charts: Problems and Special Cases Cusum Methods Process Capability-Attributes, Events, and Normally Distributed Data Capability; Non-Normal Distributions Evaluating the Precision of a Measurement System (Gauge Capability) Getting More from Control Chart Data SPC in ""Non-Product"" Applications Appendices

Full Product Details

Author:   D Bissell ,  Chris Chatfield (University of Bath, UK) ,  Jim Zidek (University of British Columbia, Vancouver, Canada) ,  Jim Lindsey (University of Liege, Liege, Belgium)
Publisher:   Taylor & Francis Ltd
Imprint:   Chapman & Hall/CRC
Volume:   26
Dimensions:   Width: 21.00cm , Height: 2.40cm , Length: 28.00cm
Weight:   0.634kg
ISBN:  

9780412394409


ISBN 10:   0412394405
Pages:   384
Publication Date:   15 May 1994
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

"Introduction - statistics, SPC and total quality; data collection and graphical summaries; numerical data summaries - location and dispersion; probability and distribution; sampling, estimation and confidence; simple tests of hypotheses - ""significance tests""; control charts for process management and improvement; control charts for average and variation; control charts for ""single-valued"" observations; control charts for attributes and events; control charts - problems and special cases; cusum methods; process capability - attributes, events and normally distributed data; capability - non-normal distributions; evaluating the precision of a measurement system (gauge capability); getting more from control chart data; SPC in ""non-product"" applications. Appendices: linear combinations of independent variables; linear combination of correlated variables; products and quotients; non-linear functions; dealing with composite functions; other useful standard errors."

Reviews

This book should be compulsory reading for every quality management consultant, applied statistician, and student of quality or statistics. It finds the right balance between data analysis and commonsense management which few people ever strike. -The Statistician


This book should be compulsory reading for every quality management consultant, applied statistician, and student of quality or statistics. It finds the right balance between data analysis and commonsense management which few people ever strike. -The Statistician


Author Information

D Bissell

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