Statistical Aspects of Quality Control
Author:   Derman Cyrus (Columbia University) ,  Sheldon M. Ross (Professor, Department of Industrial and Systems Engineering, University of Southern California, Los Angeles, USA)
Publisher:   Elsevier Science Publishing Co Inc
ISBN:  

9780122100109


Pages:   200
Publication Date:   21 November 1996
Format:   Hardback
Availability:   In Print   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

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Statistical Aspects of Quality Control


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Full Product Details

Author:   Derman Cyrus (Columbia University) ,  Sheldon M. Ross (Professor, Department of Industrial and Systems Engineering, University of Southern California, Los Angeles, USA)
Publisher:   Elsevier Science Publishing Co Inc
Imprint:   Academic Press Inc
Dimensions:   Width: 15.20cm , Height: 1.60cm , Length: 22.90cm
Weight:   0.530kg
ISBN:  

9780122100109


ISBN 10:   0122100107
Pages:   200
Publication Date:   21 November 1996
Audience:   College/higher education ,  Tertiary & Higher Education
Format:   Hardback
Publisher's Status:   Out of Print
Availability:   In Print   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

Table of Contents

Introduction. Elements of Probability. Statistical Inference. Off-Line Quality Control. Shewhart Control Charts. More General Control Charts. Sampling Inspection by Attributes. Sampling Inspection by Variables--A Loss FunctionApproach. Subject Index.

Reviews

"""The book is well written and easy to follow."" --Enrique Del Castillo, University of Texas-Arlington, THE AMERICAN SATISTICIAN ""...the book is useful to both statistician and nonstatistician audiences..."" --Robert O'Donnell, Hewlett-Packard, TECHNOMETRICS"


The book is well written and easy to follow. -Enrique Del Castillo, University of Texas-Arlington, THE AMERICAN SATISTICIAN ...the book is useful to both statistician and nonstatistician audiences... -Robert O'Donnell, Hewlett-Packard, TECHNOMETRICS


The book is well written and easy to follow. --Enrique Del Castillo, University of Texas-Arlington, THE AMERICAN SATISTICIAN ...the book is useful to both statistician and nonstatistician audiences... --Robert O'Donnell, Hewlett-Packard, TECHNOMETRICS


Author Information

Dr. Sheldon M. Ross is a professor in the Department of Industrial and Systems Engineering at the University of Southern California. He received his PhD in statistics at Stanford University in 1968. He has published many technical articles and textbooks in the areas of statistics and applied probability. Among his texts are A First Course in Probability, Introduction to Probability Models, Stochastic Processes, and Introductory Statistics. Professor Ross is the founding and continuing editor of the journal Probability in the Engineering and Informational Sciences. He is a Fellow of the Institute of Mathematical Statistics, a Fellow of INFORMS, and a recipient of the Humboldt US Senior Scientist Award.

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