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OverviewFull Product DetailsAuthor: Lee Bain (University of Missouri, Rolla, USA) , Max Englehardt (University of Missouri-Rolla) , Max EngelhardtPublisher: Taylor & Francis Inc Imprint: CRC Press Inc Edition: 2nd edition Volume: 115 Dimensions: Width: 15.60cm , Height: 3.00cm , Length: 23.40cm Weight: 0.816kg ISBN: 9780824785062ISBN 10: 0824785061 Pages: 512 Publication Date: 29 March 1991 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsPREFACE, 1. PROBABILISTIC MODELS, 2. BASIC STATISTICAL INFERENCE, 3. THE EXPONENTIAL DISTRIBUTION, 4. THE WEIBULL DISTRIBUTION, 5. THE GAMMA DISTRIBUTION, 6. EXTREME-VALUE DISTRIBUTIONS, 7. THE LOGISTIC AND OTHER DISTRIBUTIONS, 8. GOODNESS-OF-FIT TESTS, 9. REPAIRABLE SYSTEMS, APPENDIXES, REFERENCES, INDEXReviewsAuthor InformationBain, Lee Tab Content 6Author Website:Countries AvailableAll regions |