Statistical Analysis of Microstructures in Materials Science

Author:   Joachim Ohser (Institute of Industrial Mathematics, Kaiserslautern, Germany) ,  Frank Mücklich (Saarland University, Saarbrücken, Germany)
Publisher:   John Wiley & Sons Inc
ISBN:  

9780471974864


Pages:   416
Publication Date:   24 October 2000
Format:   Hardback
Availability:   Out of stock   Availability explained
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Statistical Analysis of Microstructures in Materials Science


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Author:   Joachim Ohser (Institute of Industrial Mathematics, Kaiserslautern, Germany) ,  Frank Mücklich (Saarland University, Saarbrücken, Germany)
Publisher:   John Wiley & Sons Inc
Imprint:   John Wiley & Sons Inc
Dimensions:   Width: 16.00cm , Height: 2.80cm , Length: 23.60cm
Weight:   0.737kg
ISBN:  

9780471974864


ISBN 10:   0471974862
Pages:   416
Publication Date:   24 October 2000
Audience:   College/higher education ,  Professional and scholarly ,  General/trade ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Dedication to Günter Bach. Preface. Series Preface. Acknowledgements. List of Notation. List of Source Codes. Introduction. Methodological Tools. Statistical Estimation of Basic Characteristics. Basic Characteristics and Digitalization. Covariance and Spectral Density. Size Distribution of Spherical Particles. Nonspherical Particles of Constant Shape. Size-Shape Distribution of Particles. Arrangement of Objects. Single-Phase Polyhedral Microstructures. Appendix A: Characteristics of Geometric Objects. Appendix B: Software Utilities. References. Index.

Reviews

.,. provides many examples...comprehensive discussions...an introduction to the analysis of two-dimensional and three-dimensional microscopic images...references are comprehensive... (Short Book Reviews, Vol. 21, No. 2, August 2001) <br> There is no book I know in our own field that deals with the subject in anything like the depth and breadth as this one does. (European Journal of Soil Science, No. 52 2001) <br> It can be expected that this unusually careful work will soon be acknowledged as an authoritative treatment, and certainly it will remain a major reference of applied stereology in the next two decades at least. Scientific and technical libraries should have multiple copies available. (Ceramics, Vol.45 No.3, 2001) <br> .,. an ideal textbook for a one-semester course...also an excellent reference book... (Technometrics, February 2002)


...provides many examples...comprehensive discussions...an introduction to the analysis of two-dimensional and three-dimensional microscopic images...references are comprehensive... (Short Book Reviews, Vol. 21, No. 2, August 2001) There is no book I know in our own field that deals with the subject in anything like the depth and breadth as this one does. (European Journal of Soil Science, No. 52 2001) It can be expected that this unusually careful work will soon be acknowledged as an authoritative treatment, and certainly it will remain a major reference of applied stereology in the next two decades at least. Scientific and technical libraries should have multiple copies available. (Ceramics, Vol.45 No.3, 2001) ...an ideal textbook for a one-semester course...also an excellent reference book... (Technometrics, February 2002)


Author Information

Joachim Ohser holds a Chair at University of Applied Sciences, Darmstadt, Germany, where he is a professor in the field of image processing. He has long experience with characterization and geometric modelling of microstructures. Since 1999 he heads the working group on quantitative microstructural analysis of the German Materials Society. His research focuses on stochastic and discrete geometry, image analysis and simulation of materials properties.

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