Overview
This updated edition of the industry's classic text combines the theory, practice, and latest technology of spectrum and network measurements in electronic systems to offer a comprehensive and easy way to understand frequency domain measurements. Spectrum and Network Measurements, 2nd Edition has been completely updated to take into account the latest technology, particularly focusing on the shift from analog to digital in communication systems, plus an important new chapter on EMC measurements of radiated and conducted emissions has also been added. Using simplified block diagrams, this book offers a thorough coverage of critical concepts, such as decibels, Fourier analysis, noise effects, impedance matching, intermodulation distortion, reflection measurements, and S-Parameters. By picking up where the majority of electrical engineering programs stop, this title takes basic EE theory and translates it to the world of electronic measurements. This enables the reader to understand the basic theory of signals and systems, relate it to measured results, and apply it when creating new designs.
Full Product Details
Author: Robert A. Witte
Publisher: SciTech Publishing Inc
Imprint: SciTech Publishing Inc
Edition: 2nd edition
Dimensions:
Width: 17.80cm
, Height: 2.80cm
, Length: 25.40cm
Weight: 0.916kg
ISBN: 9781613530146
ISBN 10: 1613530145
Pages: 359
Publication Date: 17 October 2014
Audience:
College/higher education
,
Professional and scholarly
,
Tertiary & Higher Education
,
Professional & Vocational
Format: Hardback
Publisher's Status: Active
Availability: In Print
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Reviews
Obviously, this one book cannot cover all the history and engineering details related to RF/microwave spectrum and network measurements; but it is an excellent starting place. And it includes many helpful hints, such as the use of different components, such as power dividers/combiners and attenuators for improving return loss and other parameters related to enhancing measurement accuracy.
Obviously, this one book cannot cover all the history and engineering details related to RF/microwave spectrum and network measurements; but it is an excellent starting place. And it includes many helpful hints, such as the use of different components, such as power dividers/combiners and attenuators for improving return loss and other parameters related to enhancing measurement accuracy. --Jack Browne, Technical Contributor
Author Information
Robert A. Witte received a BSEE degree from Purdue University and MSEE degree from Colorado State University. He has spent his entire career in the test and measurement industry, working for Hewlett-Packard, Agilent Technologies, and Keysight Technologies. Robert has contributed to the development of spectrum analyzers, network analyzers, oscilloscopes and other instruments. He has held a number of R&D management positions and is currently the Vice President of Technology Leadership for Keysight Technologies. Robert is also the author of Electronic Test Instruments: Analog and Digital Measurements.
