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OverviewFull Product DetailsAuthor: Harland G. Tompkins (Motorola, Inc.) , William A. McGahan (Nanometrics, Inc.)Publisher: John Wiley & Sons Inc Imprint: Wiley-Interscience Dimensions: Width: 16.00cm , Height: 2.00cm , Length: 24.00cm Weight: 0.533kg ISBN: 9780471181729ISBN 10: 0471181722 Pages: 248 Publication Date: 06 April 1999 Audience: College/higher education , Professional and scholarly , Undergraduate , Postgraduate, Research & Scholarly Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsPerspective and History. Fundamentals. Optical Properties of Materials and Layered Structures. Instrumentation. The Anatomy of a Reflectance Spectrum. Aspects of Single-Wavelength Ellipsometry. The Anatomy of an Ellipsometric Spectrum. Analytical Methods and Approach. Optical Data Analysis. Quality Assurance. Very Thin Films. Roughness. Appendices. Index.ReviewsAuthor InformationHarland Tompkins retired from full-time employment in 2001. During his full-time employment, he was employed by General Electric Co., Bell Laboratories, the Idaho National Engineering Lab, and Motorola. William A. McGahan is the author of Spectroscopic Ellipsometry and Reflectometry: A User's Guide, published by Wiley. Tab Content 6Author Website:Countries AvailableAll regions |
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