Software Trace and Log Analysis: A Pattern Reference
Author:   Dmitry Vostokov ,  Software Diagnostics Institute
Publisher:   Opentask
ISBN:  

9781908043801


Pages:   200
Publication Date:   09 February 2015
Format:   Paperback
Availability:   In Print   Availability explained
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Software Trace and Log Analysis: A Pattern Reference


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Overview

General trace and log analysis patterns allow application of uniform problem detection and solving approach across diverse software environments. This pattern language covers any execution artifact from a small debugging trace to a distributed log with billions of messages from hundreds of computers, thousands of software components, threads, and processes. Pattern-oriented trace and log analysis is applicable to troubleshooting and debugging Windows, Mac OS X, Linux, FreeBSD, Android, iOS, z/OS, and any other possible computer platform. Its pattern catalog is a part of pattern-oriented software diagnostics, forensics, and prognostics developed by Software Diagnostics Institute (DumpAnalysis.org + TraceAnalysis.org). This reference reprints with corrections 100 patterns originally published in Memory Dump Analysis Anthology volumes 3 - 8a and Software Diagnostics Library (former Crash Dump Analysis blog, DumpAnalysis.org/blog). Full-color diagrams accompany most pattern descriptions.

Full Product Details

Author:   Dmitry Vostokov ,  Software Diagnostics Institute
Publisher:   Opentask
Imprint:   Opentask
Dimensions:   Width: 14.00cm , Height: 1.30cm , Length: 21.60cm
Weight:   0.227kg
ISBN:  

9781908043801


ISBN 10:   1908043806
Pages:   200
Publication Date:   09 February 2015
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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