Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques

Author:   Behnam Ghavami ,  Mohsen Raji
Publisher:   Springer Nature Switzerland AG
Edition:   2021 ed.
ISBN:  

9783030516093


Pages:   114
Publication Date:   14 October 2020
Format:   Hardback
Availability:   Manufactured on demand   Availability explained
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Soft Error Reliability of VLSI Circuits: Analysis and Mitigation Techniques


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Author:   Behnam Ghavami ,  Mohsen Raji
Publisher:   Springer Nature Switzerland AG
Imprint:   Springer Nature Switzerland AG
Edition:   2021 ed.
Weight:   0.454kg
ISBN:  

9783030516093


ISBN 10:   3030516091
Pages:   114
Publication Date:   14 October 2020
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Introduction: Soft Error Modeling.- Soft Error Rate Estimation of VLSI circuits.- Process Variation Aware Soft Error Rate Estimation Method for Integrated Circuits.- GPU-Accelerated Soft Error Rate Analysis of Large-scale Integrated Circuits.- FPGA Hardware Acceleration of Soft Error Rate Estimation of Digital Circuits.- Soft Error Tolerant Circuit Design using Partitioning-based Gate Sizing.- Resynthesize Technique for Soft Error Tolerant Design of Combinational Circuits.

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Author Information

Behnam Ghavami was born in Esfarayen, Iran. He received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran, Iran. He has been serving as a Faculty Member with the Computer Engineering Department, Shahid Bahonar University of Kerman, since 2010, where he is currently Tenured Associate Professor. He teaches courses in design of digital systems, computer architecture, FPGA design, and reliable circuit design. He has supervised or co-supervised about 20 graduate students. He has published over 100 refereed papers. His research interests include the design automation of digital systems, robust logic designs, and FPGA-based design. He is currently an Associate Editor of the Journal of Electronic Testing-Springer and Microelectronics Journal-Elsevier. He has a decade of industry experience, including working on FPGA systems in industry. Mohsen Raji received his Ph.D. degree in computer engineering from Amirkabir University of Technology, Tehran,Iran. He has been serving as an Assistant Professor in School of Electrical and Computer Engineering, Shiraz University, Shiraz, Iran, since 2015. He teaches courses such as VLSI systems design, microprocessors, embedded systems, fault tolerant system design. He has supervised or co-supervised about 10 graduate students and published over 30 refereed papers. He is serving as an associated editor of Iranian Journal of Science and Technology, Transactions of Electrical Engineering. His current research interests include dependable computing, reliable and robust logic designs, design automation of digital systems, and embedded systems.

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