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OverviewA complete and comprehensive study of transport phenomena in thin continuous metal films, this book reviews work carried out on external-surface and grain-boundary electron scattering and proposes new theoretical equations for transport properties of these films. It presents a complete theoretical view of the field, and considers imperfection and impurity effects. Full Product DetailsAuthor: C R Tellier , A J Tosser , G SiddallPublisher: Elsevier Publishing Company Imprint: Elsevier Publishing Company ISBN: 9781322277448ISBN 10: 1322277443 Pages: 321 Publication Date: 01 January 2013 Audience: General/trade , General Format: Electronic book text Publisher's Status: Active Availability: Available To Order ![]() We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |