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Author:   A. Perez ,  R. Coussement
Publisher:   Springer Science+Business Media
Imprint:   Kluwer Academic/Plenum Publishers
Edition:   1980 ed.
Volume:   47
Weight:   1.041kg
ISBN:  

9780306402999

ISBN 10:   0306402998
Pages:   520
Publication Date:   01 January 1980
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock  
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Table of Contents

General Introduction.- I Basic Notions on Implantation.- Basic Implantation Processes.- Ion Implantation Procedure.- Radiation Damage as Probed by Impurities.- II Characterization by Nuclear Methods of Isolated Implanted Atom Sites.- Magnetic Hyperfine Interactions in Implanted Systems.- Quadrupole Interaction.- Isomer Shift and Recoilless Fraction.- Time Dependent Hyperfine Interactions.- Directional Distribution of Nuclear Gamma Radiation.- Nuclear Orientation.- NMR Detected by Nuclear Radiation: NMR/ON.- Mössbauer Spectroscopy.- Perturbed Angular Correlation.- Atom Site Characterization in Metals Using Channeling Techniques.- III Implantation Effects at Higher Concentrations, Aggregation Phenomena.- Radiation Effects in Metals.- Precipitation Processes in Implanted Materials.- Equilibrium Phase Formation by Ion Implantation.- Formation of Nonequilibrium Systems by Ion Implantation.- Perturbations of the Sputtering Yield.- IV Applicability of Solid State and Nuclear Methods.- to Some Solid State Methods for the Study of Isolated Implanted Atom Sites in Metals.- An Introduction to Several Solid State Techniques for the Study of Ion Implanted Materials.- Nuclear Methods for Studying Aggregation Problems.- Comparison Between Nuclear Physics Methods and Solid State Physics Methods for the Study of Implanted Atoms Sites in Metals: Solid State Methods.- Comparison of Nuclear Methods with Solid State Methods: Nuclear Methods.- V New Fields of Applications.- Surface Property Modification in Ion-Implanted Metals.- Implantation in Optical Materials.- A General Survey of the Panel Discussions.- Concluding Remarks.- Participants.

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