Semiconductor Material and Device Characterization
Author:   Dieter K. Schroder (Arizona State University)
Publisher:   John Wiley & Sons Inc
Edition:   3rd edition
ISBN:  

9780471739067


Pages:   800
Publication Date:   17 February 2006
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Semiconductor Material and Device Characterization


Overview

Full Product Details

Author:   Dieter K. Schroder (Arizona State University)
Publisher:   John Wiley & Sons Inc
Imprint:   Wiley-IEEE Press
Edition:   3rd edition
Dimensions:   Width: 16.30cm , Height: 5.10cm , Length: 23.90cm
Weight:   1.247kg
ISBN:  

9780471739067


ISBN 10:   0471739065
Pages:   800
Publication Date:   17 February 2006
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Reviews

I strongly recommend this book for those who want to learn device characterization. (IEEE Circuits & Devices Magazine, November/December 2006)


The book is well-illustrated and provides an ample bibliography. (Optics & Photonics News, 4 November 2015) I strongly recommend this book for those who want to learn device characterization. (IEEE Circuits & Devices Magazine, November/December 2006)


Author Information

DIETER K. SCHRODER, PhD, is Professor, Department of Electrical Engineering, Arizona State University. He is a recipient of the ASU College of Engineering Teaching Excellence Award and several other teaching awards. In addition to Semiconductor Material and Device Characterization, Dr. Schroder is the author of Advanced MOS Devices.

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