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Author:   Guy LeLay ,  Jacques Derrien ,  Nino Boccara
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover Reprint of the Original 1st 1987 ed.
Volume:   22
Dimensions:   Width: 17.00cm , Height: 2.10cm , Length: 24.40cm
Weight:   0.701kg
ISBN:  

9783642729690

ISBN 10:   364272969
Pages:   389
Publication Date:   06 December 2011
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand  
We will order this item for you from a manufactured on demand supplier.

Table of Contents

I Introduction.- An Introduction to the Formation and Properties of Semiconductor Interfaces.- II Experimental Study of the Formation of Semiconductor Interfaces.- Formation of Semiconductor Interfaces During Molecular Beam Epitaxy.- Build-up and Characterization of “Artificial” Surfaces for III-V Compound Semiconductors.- III Structural Characterization of the Interfaces.- Atomic Structure of Semiconductor Surfaces.- Monolayer Sensitive X-Ray Diffraction Techniques: A Short Guided Tour Through the Literature.- SEXAFS for Semiconductor Interface Studies.- XANES and XARS for Semiconductor Interface Studies.- Recent Progress in Electron Spectroscopy: Application to the Local Geometry Determination at Surfaces and Interfaces.- On the Use of Electron Microscopy in the Study of Semiconductor Interfaces.- Analytical Scanning Electron Microscopy Under Ultra High Vacuum.- Scanning Tunneling Microscopy and Spectroscopy.- Field Emission Microscopy for Analysis of Semiconductor Surfaces.- Surface and Interface Studies with MeV Ion Beams.- Surface Characterization by Low-Energy Ion Scattering.- IV Electronic Properties of Interfaces.- Band Structure Theory of Semiconductor Surfaces and Interfaces.- Electronic Properties of Semiconductors: Fermi Level Pinning in Schottky Barriers and Band Line-up in Semiconductors.- Photoemission and Inverse Photoemission from Semiconductor Interfaces.- Photoelectron Spectroscopies: Probes of Chemical Bonding and Electronic Properties at Semiconductor Interfaces.- Two-Photon Photoemission in Semiconductors.- Formation and Electrical Properties of Metal-Semiconductor Contacts.- Deep Level Transient Spectroscopy for Semiconductor Surface and Interface Analysis.- Admittance Spectroscopy of Interface States in Metal/Semiconductor Contacts.- VOptical and Vibrational Properties of Interfaces.- Optical Properties of Surfaces and Interfaces.- Vibrational Properties at Semiconductor Surfaces and Interfaces.- Raman Scattering from Interface Regions: Structure, Composition and Electronic Properties.- VI Interfaces: Present Status and Perspectives.- Role of Interfaces in Semiconductor Heterostructures.- The Physics of Metal Base Transistors.- Perspectives on Formation and Properties of Semiconductor Interfaces.- Index of Contributors.

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