Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy
Author:   Wai Kin Chim (National University of Singapore)
Publisher:   John Wiley & Sons Inc
ISBN:  

9780471492405


Pages:   288
Publication Date:   10 November 2000
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Semiconductor Device and Failure Analysis: Using Photon Emission Microscopy


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Full Product Details

Author:   Wai Kin Chim (National University of Singapore)
Publisher:   John Wiley & Sons Inc
Imprint:   John Wiley & Sons Inc
Dimensions:   Width: 16.00cm , Height: 2.00cm , Length: 23.70cm
Weight:   0.539kg
ISBN:  

9780471492405


ISBN 10:   047149240
Pages:   288
Publication Date:   10 November 2000
Audience:   College/higher education ,  Professional and scholarly ,  Undergraduate ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

Table of Contents

Reviews

This reference details the principles of design, calibration, and use of photon emission microscopy (PEM) as a fault localization technique used for analyzing device reliability and failure. (SciTech Book News Vol. 25, No. 2 June 2001)


(SciTech Book News Vol. 25, No. 2 June 2001)


This reference details the principles of design, calibration, and use of photon emission microscopy (PEM) as a fault localization technique used for analyzing device reliability and failure. (SciTech Book News Vol. 25, No. 2 June 2001) (SciTech Book News Vol. 25, No. 2 June 2001) -This reference details the principles of design, calibration, and use of photon emission microscopy (PEM) as a fault localization technique used for analyzing device reliability and failure.- (SciTech Book News Vol. 25, No. 2 June 2001)


-This reference details the principles of design, calibration, and use of photon emission microscopy (PEM) as a fault localization technique used for analyzing device reliability and failure.- (SciTech Book News Vol. 25, No. 2 June 2001)


Author Information

Wai Kin Chim is the author of Semiconductor Device and Failure Analysis : Using Photon Emission Microscopy , published by Wiley.

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