Overview

Discussing the structure and evolution of the self-trapped exciton (STE) in a range of materials, this work includes a comprehensive review of experiments and extensive tables of data. Emphasis is given throughout to the unity of the basic physics underlying various manifestations of self-trapping, with the theory being developed from a localized, atomistic perspective. The topics treated in detail in relation to STE relaxation include spontaneous symmetry breaking, lattice defect formation, radiation damage and electronic sputtering.

Full Product Details

Author:   K.S. Song ,  Y. Toyozawa ,  Richard T. Williams
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover reprint of the original 2nd ed. 1996
Volume:   105
Dimensions:   Width: 15.50cm , Height: 2.20cm , Length: 23.50cm
Weight:   0.655kg
ISBN:  

9783540604464

ISBN 10:   3540604464
Pages:   410
Publication Date:   18 March 1996
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   In Print  
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