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OverviewThis unique volume assembles the author's scientific and engineering achievements of the past three decades in the areas of (1) semiconductor physics and materials, including topics in deep level defects and band structures, (2) CMOS devices, including the topics in device technology, CMOS device reliability, and nano CMOS device quantum modeling, and (3) Analog Integrated circuit design. It reflects the scientific career of a semiconductor researcher educated in China during the 20th century. The book can be referenced by research scientists, engineers, and graduate students working in the areas of solid state and semiconductor physics and materials, electrical engineering and semiconductor devices, and chemical engineering. Full Product DetailsAuthor: Ming Fu Li (Fudan Univ, China & Nus, S'pore)Publisher: Imperial College Press Imprint: Imperial College Press Dimensions: Width: 16.00cm , Height: 2.50cm , Length: 23.10cm Weight: 0.885kg ISBN: 9781848164062ISBN 10: 1848164068 Pages: 528 Publication Date: 03 March 2011 Audience: College/higher education , Professional and scholarly , Tertiary & Higher Education , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: In Print This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsDefects in Semiconductors; Semiconductor Band Structures; Analog Integrated Circuit Design; CMOS Device Reliability; CMOS Technology; Nano CMOS Device Quantum Simulation.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |
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