Selected Semiconductor Research

Author:   Ming Fu Li (Fudan Univ, China & Nus, S'pore)
Publisher:   Imperial College Press
ISBN:  

9781848164062


Pages:   528
Publication Date:   03 March 2011
Format:   Hardback
Availability:   In Print   Availability explained
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Selected Semiconductor Research


Overview

This unique volume assembles the author's scientific and engineering achievements of the past three decades in the areas of (1) semiconductor physics and materials, including topics in deep level defects and band structures, (2) CMOS devices, including the topics in device technology, CMOS device reliability, and nano CMOS device quantum modeling, and (3) Analog Integrated circuit design. It reflects the scientific career of a semiconductor researcher educated in China during the 20th century. The book can be referenced by research scientists, engineers, and graduate students working in the areas of solid state and semiconductor physics and materials, electrical engineering and semiconductor devices, and chemical engineering.

Full Product Details

Author:   Ming Fu Li (Fudan Univ, China & Nus, S'pore)
Publisher:   Imperial College Press
Imprint:   Imperial College Press
Dimensions:   Width: 16.00cm , Height: 2.50cm , Length: 23.10cm
Weight:   0.885kg
ISBN:  

9781848164062


ISBN 10:   1848164068
Pages:   528
Publication Date:   03 March 2011
Audience:   College/higher education ,  Professional and scholarly ,  Tertiary & Higher Education ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

Table of Contents

Defects in Semiconductors; Semiconductor Band Structures; Analog Integrated Circuit Design; CMOS Device Reliability; CMOS Technology; Nano CMOS Device Quantum Simulation.

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Author Information

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Latest Reading Guide

NOV RG 20252

 

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