Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979
Author:   A. Benninghoven ,  C.A. Jr. Evans ,  R.A. Powell ,  R. Shimizu
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   Softcover reprint of the original 1st ed. 1979
Volume:   9
ISBN:  

9783642618734


Pages:   300
Publication Date:   13 December 2011
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Secondary Ion Mass Spectrometry SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II) Stanford University, Stanford, California, USA August 27–31, 1979


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Overview

This volume contains the proceedings of the Tenth International Converence on Secondary Ion Mass Spectrometry (SIMS X). It covers a diverse field of research ranging from environmental problems to depth profiling and semiconductors. In doing so, it provides an excellent overview of current research and technology by acknowledged experts in their specialised fields.

Full Product Details

Author:   A. Benninghoven ,  C.A. Jr. Evans ,  R.A. Powell ,  R. Shimizu
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   Softcover reprint of the original 1st ed. 1979
Volume:   9
Dimensions:   Width: 15.20cm , Height: 1.70cm , Length: 22.90cm
Weight:   0.466kg
ISBN:  

9783642618734


ISBN 10:   3642618731
Pages:   300
Publication Date:   13 December 2011
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

I. Fundamentals Chairpersons: D.E. Harrison and C.A. Evans, Jr..- II. Quantitation Chairpersons: D.B. Wittry and P. Williams.- III. Semiconductors Chairpersons: C.W. Magee and W. Werner.- IV. Static SIMS Chairperson: A. Benninghoven.- V. Metallurgy Chairpersons: J.D. Brown and A.P. von Rosenstiel.- VI. Instrumentation Chairpersons: D.S. Simons and F.G. Rüdenauer.- VII. Geology Chairpersons: J. Okano and C. Meyer.- VIII. Panel Discussion Chairperson: I.L. Kofsky.- IX. Biology Chairpersons: M.S. Burns and G.H. Morrison.- X. Combined Techniques Chairpersons: C. Johnson and W.H. Christie.- XI. Postdeadline Papers.- Index of Authors.

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