Secondary Ion Mass Spectrometry, SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979
Author:   A. Benninghoven ,  C. A. Evans ,  R. A. Powell ,  R. Shimizu
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Volume:   9
ISBN:  

9783540098430


Pages:   314
Publication Date:   03 March 1980
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Secondary Ion Mass Spectrometry, SIMS II: Proceedings of the Second International Conference on Secondary Ion Mass Spectrometry (SIMS II), Stanford University, Stanford, California, USA, August 27-31, 1979


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Author:   A. Benninghoven ,  C. A. Evans ,  R. A. Powell ,  R. Shimizu
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Volume:   9
Weight:   0.745kg
ISBN:  

9783540098430


ISBN 10:   3540098437
Pages:   314
Publication Date:   03 March 1980
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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