Secondary Ion Mass Spectrometry: Fundamentals, Advancements and Applications
Author:   Paweł Piotr Michałowski (Institute of Microelectronics and Photonics, Poland)
Publisher:   Royal Society of Chemistry
Volume:   Volume 16
ISBN:  

9781837671007


Pages:   576
Publication Date:   06 June 2025
Format:   Hardback
Availability:   In Print   Availability explained
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Secondary Ion Mass Spectrometry: Fundamentals, Advancements and Applications


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Author:   Paweł Piotr Michałowski (Institute of Microelectronics and Photonics, Poland)
Publisher:   Royal Society of Chemistry
Imprint:   Royal Society of Chemistry
Volume:   Volume 16
Dimensions:   Width: 15.60cm , Height: 3.30cm , Length: 23.40cm
Weight:   1.015kg
ISBN:  

9781837671007


ISBN 10:   1837671001
Pages:   576
Publication Date:   06 June 2025
Audience:   College/higher education ,  Postgraduate, Research & Scholarly
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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