Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)
Author:   Sarah Fearn ,  Alexander Shard
Publisher:   Institute of Physics Publishing
Edition:   2nd ed.
ISBN:  

9780750333320


Pages:   125
Publication Date:   26 August 2025
Format:   Paperback
Availability:   Available To Order   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

Our Price $79.20 Quantity:  
Add to Cart

Share |

Secondary Ion Mass Spectrometry and Its Application to Materials Science (Second Edition)


Overview

In this edition, a more detailed overview of the principles of SIMS is given, and of how the development of dual-beam instruments has blurred the traditional fields of dynamic and static SIMS to enable greater analytical possibilities. This is an ideal text for final year undergraduates, first year PhD students, and anyone who may be starting out using secondary ion mass spectrometry as part of their research.

Full Product Details

Author:   Sarah Fearn ,  Alexander Shard
Publisher:   Institute of Physics Publishing
Imprint:   Institute of Physics Publishing
Edition:   2nd ed.
ISBN:  

9780750333320


ISBN 10:   0750333324
Pages:   125
Publication Date:   26 August 2025
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Unknown
Availability:   Available To Order   Availability explained
Limited stock is available. It will be ordered for you and shipped pending supplier's limited stock.

Table of Contents

Reviews

Author Information

Tab Content 6

Author Website:  

Countries Available

All regions
Latest Reading Guide

April RG 26_2

 

Shopping Cart
Your cart is empty
 Shopping cart
Mailing List

 

Sign up now