Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices

Author:   Paul van der Heide
Publisher:   John Wiley & Sons Inc
ISBN:  

9781118480489


Pages:   384
Publication Date:   17 October 2014
Format:   Hardback
Availability:   Out of stock   Availability explained
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Secondary Ion Mass Spectrometry: An Introduction to Principles and Practices


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Full Product Details

Author:   Paul van der Heide
Publisher:   John Wiley & Sons Inc
Imprint:   John Wiley & Sons Inc
Dimensions:   Width: 16.30cm , Height: 2.50cm , Length: 24.10cm
Weight:   0.662kg
ISBN:  

9781118480489


ISBN 10:   1118480481
Pages:   384
Publication Date:   17 October 2014
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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<p> The entire book, and especially the second part, is a good reference work for users of D-SIMS and S-SIMS and for those working in other methods in analytical chemistry and the applied scientific fields, including the biosciences, where SIMS is now becoming a major experimental method. (Anal Bioanal Chem, 21 February 2015)


Author Information

Paul van der Heide is a recognized leader in surface analysis with emphasis on the application of Secondary Ion Mass Spectrometry (SIMS). This interest started during his PhD (completed in 1992 at the University of Auckland) which involved the design and construction of a magnetic sector SIMS instrument. Paul has since been heavily involved in the application and development of SIMS at the University of Western Ontario, the University of Houston (where he also filled in various Professor level positions), Samsung Austin Semiconductor, and most recently at GlobalFoundries (NY). Paul has ~100 publications with this representing his 2nd book.   

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