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OverviewAt this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed. Special emphasis was placed on the manipulation and analysis of single atoms, molecules, nanostructures, and biological entities like DNA, viruses, or cells and the analysis of materials and surfaces on the atomic or molecular level. Full Product DetailsAuthor: Paul M. Koenraad , Martijn KemerinkPublisher: American Institute of Physics Imprint: American Institute of Physics Volume: v. 696 Dimensions: Width: 16.20cm , Height: 1.90cm , Length: 23.40cm Weight: 0.540kg ISBN: 9780735401686ISBN 10: 0735401683 Pages: 197 Publication Date: 19 December 2003 Audience: General/trade , Professional and scholarly , College/higher education , General , Professional & Vocational Format: Mixed media product Publisher's Status: Active Availability: In Print ![]() This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us. Table of ContentsReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |