Scanning Tunneling Microscopy/ Spectroscopy and Related Techniques: 12th International Conference, STM'03

Author:   Paul M. Koenraad ,  Martijn Kemerink
Publisher:   American Institute of Physics
Volume:   v. 696
ISBN:  

9780735401686


Pages:   197
Publication Date:   19 December 2003
Format:   Mixed media product
Availability:   In Print   Availability explained
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Scanning Tunneling Microscopy/ Spectroscopy and Related Techniques: 12th International Conference, STM'03


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Overview

At this conference the latest developments in the design, construction, and application of scanning probe microscopy like Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Magnetic Force Microscopy (MFM), Scanning Near-Field Optical Microscopy (SNOM) in the fields of nanotechnology, physics, chemistry, and biology were discussed. Special emphasis was placed on the manipulation and analysis of single atoms, molecules, nanostructures, and biological entities like DNA, viruses, or cells and the analysis of materials and surfaces on the atomic or molecular level.

Full Product Details

Author:   Paul M. Koenraad ,  Martijn Kemerink
Publisher:   American Institute of Physics
Imprint:   American Institute of Physics
Volume:   v. 696
Dimensions:   Width: 16.20cm , Height: 1.90cm , Length: 23.40cm
Weight:   0.540kg
ISBN:  

9780735401686


ISBN 10:   0735401683
Pages:   197
Publication Date:   19 December 2003
Audience:   General/trade ,  Professional and scholarly ,  College/higher education ,  General ,  Professional & Vocational
Format:   Mixed media product
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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