Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis
Author:   Nobuo Tanaka (Nagoya Univ, Japan)
Publisher:   Imperial College Press
ISBN:  

9781848167896


Pages:   616
Publication Date:   13 October 2014
Format:   Hardback
Availability:   In Print   Availability explained
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Scanning Transmission Electron Microscopy Of Nanomaterials: Basics Of Imaging And Analysis


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Overview

The basics, present status and future prospects of high-resolution scanning transmission electron microscopy (STEM) are described in the form of a textbook for advanced undergraduates and graduate students. This volume covers recent achievements in the field of STEM obtained with advanced technologies such as spherical aberration correction, monochromator, high-sensitivity electron energy loss spectroscopy and the software of image mapping. The future prospects chapter also deals with z-slice imaging and confocal STEM for 3D analysis of nanostructured materials.

Full Product Details

Author:   Nobuo Tanaka (Nagoya Univ, Japan)
Publisher:   Imperial College Press
Imprint:   Imperial College Press
Dimensions:   Width: 15.50cm , Height: 3.30cm , Length: 22.90cm
Weight:   1.039kg
ISBN:  

9781848167896


ISBN 10:   184816789
Pages:   616
Publication Date:   13 October 2014
Audience:   College/higher education ,  Postgraduate, Research & Scholarly ,  Undergraduate
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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