Overview
This book presents the physical and technical foundation of the state of the art in applied scanning probe techniques. It constitutes a timely and comprehensive overview of SPM applications. The chapters in this volume relate to scanning probe microscopy techniques, characterization of various materials and structures and typical industrial applications, including topographic and dynamical surface studies of thin-film semiconductors, polymers, paper, ceramics, and magnetic and biological materials. The chapters are written by leading researchers and application scientists from all over the world and from various industries to provide a broader perspective.
Full Product Details
Publisher: Springer
Imprint: Springer
ISBN: 9781283740678
ISBN 10: 1283740672
Pages: 634
Publication Date: 01 January 2013
Audience:
General/trade
,
General
Format: Undefined
Publisher's Status: Active
Availability: Available To Order

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