Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization
Author:   Dalia G. Yablon
Publisher:   John Wiley & Sons Inc
ISBN:  

9781118288238


Pages:   368
Publication Date:   28 January 2014
Format:   Hardback
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Scanning Probe Microscopy in Industrial Applications: Nanomechanical Characterization


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Author:   Dalia G. Yablon
Publisher:   John Wiley & Sons Inc
Imprint:   John Wiley & Sons Inc
Dimensions:   Width: 16.30cm , Height: 2.40cm , Length: 24.20cm
Weight:   0.667kg
ISBN:  

9781118288238


ISBN 10:   1118288238
Pages:   368
Publication Date:   28 January 2014
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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DALIA G. YABLON, PhD, developed and led a state-of-the-art scanning probe microscopy facility for more than ten years in Corporate Strategic Research, the flagship R&D center of ExxonMobil Corporation. Under her direction, scanning probe microscopy was used to characterize, conduct failure analysis, and probe structure-property relationships across all sectors of the vast petroleum business including areas of polymers, tribology, corrosion, geochemistry, and metallurgy. She currently leads SurfaceChar, a characterization consulting company.

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