Overview
Scanning Probe Microscopy brings up to date a constantly growing knowledge base of electrical and electromechanical characterization at the nanoscale. This comprehensive, two-volume set presents practical and theoretical issues of advanced scanning probe microscopy (SPM) techniques ranging from fundamental physical studies to device characterization, failure analysis, and nanofabrication. Volume 1 focuses on the technical aspects of SPM methods ranging from scanning tunneling potentiometry to electrochemical SPM, and addresses the fundamental physical phenomena underlying the SPM imaging mechanism. Volume 2 concentrates on the practical aspects of SPM characterization of a wide range of materials, including semiconductors, ferroelectrics, dielectrics, polymers, carbon nanotubes, and biomolecules, as well as on SPM-based approaches to nanofabrication and nanolithography.
Full Product Details
Author: Sergei V. Kalinin ,
Alexei Gruverman
Publisher: Springer-Verlag New York Inc.
Imprint: Springer-Verlag New York Inc.
Edition: 2007 ed.
Dimensions:
Width: 15.50cm
, Height: 3.10cm
, Length: 23.50cm
Weight: 2.180kg
ISBN: 9780387286679
ISBN 10: 0387286675
Pages: 980
Publication Date: 18 December 2006
Audience:
Professional and scholarly
,
Professional & Vocational
Format: Hardback
Publisher's Status: Active
Availability: In Print
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.
Reviews
From the reviews: <p> The stated goal of this book is a ~to provide a comprehensive reference on the nanoscale characterization of electrical and mechanical properties of functional materials by SPM techniques and to make readers aware of tremendous developments in the field in the last decade.a (TM) a ] The images are particularly clear even to the non-specialist eyes. a ] The black and white and color figures are of good quality. The photographs are all excellent. a ] will be helpful to materials scientists in universities and research centers. (Fernande Grandjean and Gary J. Long, Physicalia, Vol. 30 (2), 2008)
From the reviews: The stated goal of this book is 'to provide a comprehensive reference on the nanoscale characterization of electrical and mechanical properties of functional materials by SPM techniques and to make readers aware of tremendous developments in the field in the last decade.' ! The images are particularly clear even to the non-specialist eyes. ! The black and white and color figures are of good quality. The photographs are all excellent. ! will be helpful to materials scientists in universities and research centers. (Fernande Grandjean and Gary J. Long, Physicalia, Vol. 30 (2), 2008)
