Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale

Author:   Sergei V. Kalinin ,  Alexei Gruverman
Publisher:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 2007
ISBN:  

9781493950362


Pages:   980
Publication Date:   04 November 2016
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Our Price $871.17 Quantity:  
Add to Cart

Share |

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale


Add your own review!

Overview

Full Product Details

Author:   Sergei V. Kalinin ,  Alexei Gruverman
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   Softcover reprint of the original 1st ed. 2007
Weight:   1.578kg
ISBN:  

9781493950362


ISBN 10:   1493950363
Pages:   980
Publication Date:   04 November 2016
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

Table of Contents

Reviews

From the reviews: The stated goal of this book is 'to provide a comprehensive reference on the nanoscale characterization of electrical and mechanical properties of functional materials by SPM techniques and to make readers aware of tremendous developments in the field in the last decade.' ... The images are particularly clear even to the non-specialist eyes. ... The black and white and color figures are of good quality. The photographs are all excellent. ... will be helpful to materials scientists in universities and research centers. (Fernande Grandjean and Gary J. Long, Physicalia, Vol. 30 (2), 2008)


From the reviews: The stated goal of this book is `to provide a comprehensive reference on the nanoscale characterization of electrical and mechanical properties of functional materials by SPM techniques and to make readers aware of tremendous developments in the field in the last decade.' ... The images are particularly clear even to the non-specialist eyes. ... The black and white and color figures are of good quality. The photographs are all excellent. ... will be helpful to materials scientists in universities and research centers. (Fernande Grandjean and Gary J. Long, Physicalia, Vol. 30 (2), 2008)


From the reviews: The stated goal of this book is `to provide a comprehensive reference on the nanoscale characterization of electrical and mechanical properties of functional materials by SPM techniques and to make readers aware of tremendous developments in the field in the last decade.' ... The images are particularly clear even to the non-specialist eyes. ... The black and white and color figures are of good quality. The photographs are all excellent. ... will be helpful to materials scientists in universities and research centers. (Fernande Grandjean and Gary J. Long, Physicalia, Vol. 30 (2), 2008)


Author Information

Tab Content 6

Author Website:  

Customer Reviews

Recent Reviews

No review item found!

Add your own review!

Countries Available

All regions
Latest Reading Guide

MRG2025CC

 

Shopping Cart
Your cart is empty
Shopping cart
Mailing List