Scanning Probe Microscopy
Author:   Kate Wright
Publisher:   NY Research Press
ISBN:  

9781632384072


Pages:   256
Publication Date:   12 January 2015
Format:   Hardback
Availability:   Available To Order   Availability explained
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Scanning Probe Microscopy


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Overview

Scanning Probe Microscopy (SPM) involves forming images of surfaces using a physical scanning and detection method. The key subject of this text, scanning probe microscopy is a major tool for the progress of nanotechnology with functions in a multitude of study spheres. This book comprises of unique studies on the uses of SPM methods for the classification of physical attributes of various materials at the nano level. The various topics covered in this book vary from morphology of surfaces to analyzing thin films. The diversity of topics covered in this book reflects the prominent interdisciplinary trait of the study in the sphere of scanning probe microscopy.

Full Product Details

Author:   Kate Wright
Publisher:   NY Research Press
Imprint:   NY Research Press
Dimensions:   Width: 15.20cm , Height: 1.60cm , Length: 22.90cm
Weight:   0.513kg
ISBN:  

9781632384072


ISBN 10:   1632384078
Pages:   256
Publication Date:   12 January 2015
Audience:   General/trade ,  General
Format:   Hardback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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