Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents
Author:   Adam Foster ,  Werner A. Hofer
Publisher:   Springer-Verlag New York Inc.
Edition:   and ed.
Volume:   PREL 5700
ISBN:  

9780387400907


Pages:   282
Publication Date:   28 June 2006
Format:   Hardback
Availability:   In Print   Availability explained
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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents


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Author:   Adam Foster ,  Werner A. Hofer
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   and ed.
Volume:   PREL 5700
Dimensions:   Width: 15.50cm , Height: 1.70cm , Length: 23.50cm
Weight:   1.310kg
ISBN:  

9780387400907


ISBN 10:   0387400907
Pages:   282
Publication Date:   28 June 2006
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print   Availability explained
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.

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