Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Nanoscience and Technology.
Author:   Adam Foster ,  Werner Hofer
Publisher:   Springer
ISBN:  

9786610634514


Pages:   292
Publication Date:   01 January 2006
Format:   Electronic book text
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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Scanning Probe Microscopy: Atomic Scale Engineering by Forces and Currents. Nanoscience and Technology.


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Overview

The book discusses the analysis and manipulation of processes on the atomic scale by forces and currents and gives a broad overview from a common perspective on the different fields of Scanning Probe Microscopy (SPM). Such a combined treatment is suggested theoretically, because both are just different aspects of physical and chemical processes at atomic interfaces. Forces do play an important role in Scanning Tunneling Microscopy (STM), and currents are an important issue in Atomic Force Microscopy (AFM). Experimentally, the existence of instruments for combined force/current measurements make the same point. This unique overview fills the gap in the litterature.

Full Product Details

Author:   Adam Foster ,  Werner Hofer
Publisher:   Springer
Imprint:   Springer
ISBN:  

9786610634514


ISBN 10:   6610634513
Pages:   292
Publication Date:   01 January 2006
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Out of stock   Availability explained
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.

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