Scanning Probe Microscopy; Atomic Force Microscopy and Scanning Tunneling Microscopy
Publisher:   Springer
ISBN:  

9783662452400


Publication Date:   01 January 2015
Format:   Electronic book text
Availability:   Available To Order   Availability explained
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Scanning Probe Microscopy; Atomic Force Microscopy and Scanning Tunneling Microscopy


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Publisher:   Springer
Imprint:   Springer
ISBN:  

9783662452400


ISBN 10:   3662452405
Publication Date:   01 January 2015
Audience:   General/trade ,  General
Format:   Electronic book text
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.
Language:   Undetermined

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