Overview
Scope of the Book Synthetic and natural polymers exhibit a complex structural and morphological hierarchy on multiple length scales [1], which determines their performance. Thus, research aiming at visualizing structure and morphology using a multitude of microscopy techniques has received considerable attention since the early days of polymer science and technology. Various well-developed techniques such as optical microscopy and different forms of electron microscopy (Scanning Electron Micr- copy, SEM; Transmission Electron Microscopy, TEM; Environmental Scanning Electron Microscopy, ESEM) allow one to view polymeric structure at different levels of magni?cation. These classical techniques, and their applications to po- mers, are well documented in the literature [2, 3]. The invention of Scanning Tunneling Microscopy (STM) inspired the devel- ment of Atomic Force Microscopy (AFM) and other forms of scanning proximity microscopes in the late 1980s [4, 5]. AFM, unlike STM, can be used to image n- conducting specimens such as polymers. In addition, AFM imaging is feasible in liquids, which has several advantages. Using liquid imaging cells the forces between specimen and AFM probe are drastically reduced, thus sample damage is prevented. In addition, the use of water as imaging medium opened up new applications aiming at imaging, characterizing, and analyzing biologically important systems.
Full Product Details
Author: G. Julius Vancso ,
Holger Schönherr
Publisher: Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint: Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition: 2010 ed.
Dimensions:
Width: 15.50cm
, Height: 1.80cm
, Length: 23.50cm
Weight: 0.553kg
ISBN: 9783642012303
ISBN 10: 3642012302
Pages: 248
Publication Date: 17 May 2010
Audience:
Professional and scholarly
,
Professional & Vocational
Format: Hardback
Publisher's Status: Active
Availability: Awaiting stock
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Reviews
From the reviews: ""Atomic force microscopy (AFM) can be used to image polymer surfaces over a broad range from several nanometers to more than 100 micrometer scan sizes. ! one of the most engaging and practical books ever on the topic of AFMs. It provides the reader with insightful methods for imaging polymer surfaces at elevated temperatures and in other situations. ! would be suitable for both industrial researchers and academic personnel working in the laboratory. ! Anyone who uses an AFM will find this book extremely useful."" (IEEE Electrical Insulation Magazine, Vol. 27 (4), July/August, 2011)
From the reviews: Atomic force microscopy (AFM) can be used to image polymer surfaces over a broad range from several nanometers to more than 100 micrometer scan sizes. ... one of the most engaging and practical books ever on the topic of AFMs. It provides the reader with insightful methods for imaging polymer surfaces at elevated temperatures and in other situations. ... would be suitable for both industrial researchers and academic personnel working in the laboratory. ... Anyone who uses an AFM will find this book extremely useful. (IEEE Electrical Insulation Magazine, Vol. 27 (4), July/August, 2011)
From the reviews: Atomic force microscopy (AFM) can be used to image polymer surfaces over a broad range from several nanometers to more than 100 micrometer scan sizes. ! one of the most engaging and practical books ever on the topic of AFMs. It provides the reader with insightful methods for imaging polymer surfaces at elevated temperatures and in other situations. ! would be suitable for both industrial researchers and academic personnel working in the laboratory. ! Anyone who uses an AFM will find this book extremely useful. (IEEE Electrical Insulation Magazine, Vol. 27 (4), July/August, 2011)
