Overview

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Full Product Details

Author:   P.W. Hawkes ,  Ludwig Reimer
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   2nd completely rev. and updated ed. 1998
Volume:   45
Dimensions:   Width: 15.50cm , Height: 3.00cm , Length: 23.50cm
Weight:   2.060kg
ISBN:  

9783540639763

ISBN 10:   3540639764
Pages:   529
Publication Date:   17 September 1998
Audience:   College/higher education ,  Professional and scholarly ,  Postgraduate, Research & Scholarly ,  Professional & Vocational
Replaced By:   9783540853176
Format:   Hardback
Publisher's Status:   Active
Availability:   In Print  
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Reviews

<p>., . this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM. <p>T Mulvey, Measurement Science and Technology. 11, No12, December 2000

...this book is both linguistically and scientifically outstanding. It is an inspiring book for beginners and experienced SEM operators alike. The list of references is especially useful. This volume makes an outstanding contribution to the deeper understanding of the SEM. T Mulvey, Measurement Science and Technology. 11, No12, December 2000

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