Scanning Electron Microscopy: Physics of Image Formation and Microanalysis
Author:   Rudolf Reichelt ,  Rudolf Reichelt ,  Ludwig Reimer
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Edition:   3rd ed. 2021
ISBN:  

9783540853176


Pages:   511
Publication Date:   01 November 2010
Format:   Hardback
Availability:   Awaiting stock   Availability explained
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Scanning Electron Microscopy: Physics of Image Formation and Microanalysis


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Overview

Scanning Electron Microscopy provides a description of the physics of electron-probe formation and of electron-specimen interactions. The different imaging and analytical modes using secondary and backscattered electrons, electron-beam-induced currents, X-ray and Auger electrons, electron channelling effects, and cathodoluminescence are discussed to evaluate specific contrasts and to obtain quantitative information.

Full Product Details

Author:   Rudolf Reichelt ,  Rudolf Reichelt ,  Ludwig Reimer
Publisher:   Springer-Verlag Berlin and Heidelberg GmbH & Co. KG
Imprint:   Springer-Verlag Berlin and Heidelberg GmbH & Co. K
Edition:   3rd ed. 2021
ISBN:  

9783540853176


ISBN 10:   3540853170
Pages:   511
Publication Date:   01 November 2010
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Hardback
Publisher's Status:   Active
Availability:   Awaiting stock   Availability explained
The supplier is currently out of stock of this item. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out for you.

Table of Contents

Introduction.- Electron optics of a Scanning Electron Microscope.- Electron Scattering and Diffusion.- Emission of Backscattered and Secondary Electrons.- Electron Detectors and Spectrometers.- Image Contrast and Signal Processing.- Electron-Beam-Induced Current and Cathodoluminescence.- Special Techniques in SEM.- Crystal Structure Analysis by Diffraction.- Elemental Analysis and Imaging with X-Rays.-

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