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OverviewFull Product DetailsAuthor: Flegler , Heckman , Klomparens , Karen L. KlomparensPublisher: Oxford University Press Inc Imprint: Oxford University Press Inc Dimensions: Width: 20.50cm , Height: 1.50cm , Length: 25.90cm Weight: 0.758kg ISBN: 9780195107517ISBN 10: 0195107519 Pages: 240 Publication Date: 23 September 1993 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Unknown Availability: Out of stock ![]() Table of ContentsReviewsExcellent basic book on electron microscopy....Concepts are easy to understand. --Yolande Berta, Georgia Institute of Technology Presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Explanations coupled with diagrams and photographs guide the reader. --Journal of Chemical Education Excellent basic book on electron microscopy....Concepts are easy to understand. --Yolande Berta, Georgia Institute of Technology Presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Explanations coupled with diagrams and photographs guide the reader. --Journal of Chemical Education Excellent basic book on electron microscopy....Concepts are easy to understand. --Yolande Berta, Georgia Institute of Technology Presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Explanations coupled with diagrams and photographs guide the reader. --Journal of Chemical Education <br> Excellent basic book on electron microscopy....Concepts are easy to understand. --Yolande Berta, Georgia Institute of Technology<p><br> Presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Explanations coupled with diagrams and photographs guide the reader. --Journal of Chemical Education<p><br> Excellent basic book on electron microscopy....Concepts are easy to understand. --Yolande Berta, Georgia Institute of Technology<br> Presents the practical and theoretical fundamentals of scanning and transmission electron microscopy. Explanations coupled with diagrams and photographs guide the reader. --Journal of Chemical Education<br> Author InformationStanley L. Flegler, John W. Heckman, Jr., and Karen L. Klomparens are at the Center for Electron Optics at Michigan State University. Tab Content 6Author Website:Countries AvailableAll regions |