Scaling Effects on Metal-oxide-semiconductor Device Characteristics
Author:   Steven Walstra
Publisher:   Dissertation Discovery Company
ISBN:  

9780530002323


Pages:   152
Publication Date:   31 May 2019
Format:   Paperback
Availability:   Available To Order   Availability explained
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Scaling Effects on Metal-oxide-semiconductor Device Characteristics


Overview

"Dissertation Discovery Company and University of Florida are dedicated to making scholarly works more discoverable and accessible throughout the world. This dissertation, ""Scaling Effects on Metal-oxide-semiconductor Device Characteristics"" by Steven V. Walstra, was obtained from University of Florida and is being sold with permission from the author. A digital copy of this work may also be found in the university's institutional repository, IR@UF. The content of this dissertation has not been altered in any way. We have altered the formatting in order to facilitate the ease of printing and reading of the dissertation."

Full Product Details

Author:   Steven Walstra
Publisher:   Dissertation Discovery Company
Imprint:   Dissertation Discovery Company
Dimensions:   Width: 21.60cm , Height: 0.80cm , Length: 27.90cm
Weight:   0.367kg
ISBN:  

9780530002323


ISBN 10:   0530002329
Pages:   152
Publication Date:   31 May 2019
Audience:   General/trade ,  General
Format:   Paperback
Publisher's Status:   Active
Availability:   Available To Order   Availability explained
We have confirmation that this item is in stock with the supplier. It will be ordered in for you and dispatched immediately.

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