Sample Preparation Handbook for Transmission Electron Microscopy: Techniques

Author:   Jeanne Ayache ,  Luc Beaunier ,  Jacqueline Boumendil ,  Gabrielle Ehret
Publisher:   Springer-Verlag New York Inc.
Edition:   2010 ed.
ISBN:  

9781489998859


Pages:   338
Publication Date:   20 November 2014
Format:   Paperback
Availability:   Manufactured on demand   Availability explained
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Sample Preparation Handbook for Transmission Electron Microscopy: Techniques


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Overview

Successful transmission electron microscopy in all of its manifestations depends on the quality of the specimens examined. Biological specimen preparation protocols have usually been more rigorous and time consuming than those in the physical sciences. For this reason, there has been a wealth of scienti c literature detailing speci c preparation steps and numerous excellent books on the preparation of b- logical thin specimens. This does not mean to imply that physical science specimen preparation is trivial. For the most part, most physical science thin specimen pre- ration protocols can be executed in a matter of a few hours using straightforward steps. Over the years, there has been a steady stream of papers written on various aspects of preparing thin specimens from bulk materials. However, aside from s- eral seminal textbooks and a series of book compilations produced by the Material Research Society in the 1990s, no recent comprehensive books on thin specimen preparation have appeared until this present work, rst in French and now in English. Everyone knows that the data needed to solve a problem quickly are more imp- tant than ever. A modern TEM laboratory with supporting SEMs, light microscopes, analytical spectrometers, computers, and specimen preparation equipment is an investment of several million US dollars. Fifty years ago, electropolishing, chemical polishing, and replication methods were the principal specimen preparation me- ods.

Full Product Details

Author:   Jeanne Ayache ,  Luc Beaunier ,  Jacqueline Boumendil ,  Gabrielle Ehret
Publisher:   Springer-Verlag New York Inc.
Imprint:   Springer-Verlag New York Inc.
Edition:   2010 ed.
Dimensions:   Width: 15.50cm , Height: 1.90cm , Length: 23.50cm
Weight:   0.557kg
ISBN:  

9781489998859


ISBN 10:   1489998853
Pages:   338
Publication Date:   20 November 2014
Audience:   Professional and scholarly ,  Professional & Vocational
Format:   Paperback
Publisher's Status:   Active
Availability:   Manufactured on demand   Availability explained
We will order this item for you from a manufactured on demand supplier.

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Reviews

From the reviews: This textbook is the combined result ... of four French microscopists and one Swiss microscopist who use similar TEM techniques for the study of quite different specimens; this explains the very wide scope in terms of techniques covered which distinguishes this book from related previous ones. ... this recommendable book is useful for researchers and technicians working in TEM preparation laboratories. ... a truly indispensable manual that is guaranteed to make it onto the shelf of almost every laboratory concerned with TEM sample preparation. (Thomas Walther, Infocus Magazine, Issue 23, September, 2011)


From the reviews: This textbook is the combined result ... of four French microscopists and one Swiss microscopist who use similar TEM techniques for the study of quite different specimens; this explains the very wide scope in terms of techniques covered which distinguishes this book from related previous ones. ... this recommendable book is useful for researchers and technicians working in TEM preparation laboratories. ... a truly indispensable manual that is guaranteed to make it onto the shelf of almost every laboratory concerned with TEM sample preparation. (Thomas Walther, Infocus Magazine, Issue 23, September, 2011)


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