Overview
This two-volume Handbook is a comprehensive guide to sample preparation for the transmission electron microscope. The first volume covers general theoretical and practical aspects of the methodologies used for TEM analysis and observation of any sample. The information will help you to choose the best preparative technique for your application taking into account material types, structures, and their properties. Physical properties, material classification, and microstructures are considered together with a thorough description of the physics and chemistry of sample preparation and the main artifacts brought about by mechanical, physical and chemical methods, principles which are also applicable to sample preparation for the SEM, AFM etc.. Also included is a discussion of how to combine techniques for complex sample analysis and to obtain a TEM thin slice. Sample Preparation Handbook for Transmission Electron Microscopy: Methodology will guide you through the most current techniques for successful sample preparation in all fields from materials science to biology. The second volume, Sample Preparation Handbook for Transmission Electron Microscopy: Techniques, describes 14 different preparation techniques, including 22 detailed protocols for preparing thin slices for TEM analysis. Compatibility and pre-treatments are also discussed. Experimental conditions and guidelines, options and variations, advantages and constraints, technical hints from the authors’ years of experience, common artifacts, and theoretical issues are all considered. Particular attention is given to the type of material, conditioning, compatible analysis of a given preparation, and risks. This practical and authoritative reference companion deserves a place on the bench in every TEM lab. Key Features of the Handbook: Combines all of the latest techniques for the preparation of mineral to biologicalsamples Compares techniques in terms of their application areas, limitations, artifacts, and types of analysis (macroscopic, atomic, or molecular level) Describes physical characteristics, chemistry, structure/texture, and orientation properties of materials in relation to the most appropriate type of TEM analysis Links to a complementary interactive database website which is available to scientists worldwide* Written by authors with 100 years of combined experience in electron microscopy *http://temsamprep.in2p3.fr/
Full Product Details
Author: Jeanne Ayache ,
Luc Beaunier ,
Jacqueline Boumendil ,
Gabrielle Ehret
Publisher: Springer-Verlag New York Inc.
Imprint: Springer-Verlag New York Inc.
Dimensions:
Width: 16.50cm
, Height: 4.60cm
, Length: 24.40cm
Weight: 1.247kg
ISBN: 9781441960870
ISBN 10: 1441960872
Pages: 670
Publication Date: 09 July 2010
Audience:
Professional and scholarly
,
Professional & Vocational
Format: Book
Publisher's Status: Active
Availability: In Print
This item will be ordered in for you from one of our suppliers. Upon receipt, we will promptly dispatch it out to you. For in store availability, please contact us.
