Overview
Expert practical and theoretical coverage of runs and scans This volume presents both theoretical and applied aspects of runs and scans, and illustrates their important role in reliability analysis through various applications from science and engineering. Runs and Scans with Applications presents new and exciting content in a systematic and cohesive way in a single comprehensive volume, complete with relevant approximations and explanations of some limit theorems. The authors provide detailed discussions of both classical and current problems, such as: * Sooner and later waiting time * Consecutive systems * Start-up demonstration testing in life-testing experiments * Learning and memory models * ""Match"" in genetic codes Runs and Scans with Applications offers broad coverage of the subject in the context of reliability and life-testing settings and serves as an authoritative reference for students and professionals alike.
Full Product Details
Author: Narayanaswamy Balakrishnan (McMaster University, Canada) ,
Markos V. Koutras (University Of Piraeus, Greece)
Publisher: John Wiley & Sons Inc
Imprint: John Wiley & Sons Inc
Dimensions:
Width: 16.10cm
, Height: 2.80cm
, Length: 23.90cm
Weight: 0.780kg
ISBN: 9780471248927
ISBN 10: 0471248924
Pages: 488
Publication Date: 05 December 2001
Audience:
College/higher education
,
Professional and scholarly
,
Undergraduate
,
Postgraduate, Research & Scholarly
Format: Hardback
Publisher's Status: Active
Availability: Out of stock
The supplier is temporarily out of stock of this item. It will be ordered for you on backorder and shipped when it becomes available.
Reviews
...provides excellent coverage of the topic of scans, and runs, including a nice historical account and guide to the literature... (Technometrics, Vol. 44, No. 4, November 2002) ...highly recommended...well done and perfectly edited... (Journal of the American Statistical Association, December 2002) ...a great resource... (International Journal of General Systems, Vol. 32, 2003)
...many excellent features... (Statistical Methods in Medical Research, No.13, 2004) ...provides excellent coverage of the topic of scans, and runs, including a nice historical account and guide to the literature... (Technometrics, Vol. 44, No. 4, November 2002) ...highly recommended...well done and perfectly edited... (Journal of the American Statistical Association, December 2002) ...a great resource... (International Journal of General Systems, Vol. 32, 2003)
Author Information
N. BALAKRISHNAN, PhD, is Professor of Mathematics and Statistics at McMaster University in Hamilton, Ontario, Canada. He is also the author of A First Course in Order Statistics and four volumes of the Distributions in Statistics series (all from Wiley). MARKOS V. KOUTRAS, PhD, is Professor of Statistics at the University of Piraeus in Greece, where he researches applied probability, reliability, and distribution theory.
