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OverviewThis text addreseses the topic of surface roughness, how to measure and describe it, and what practical problems it might cause. Updated to include advances in measurement and characterization, this second edition introduces modern instruments, including laser interferometers and AFMs, and there are sections on fractals and motif analysis. Problems of 3D surface measurement and description are extensively treated. Manufacturing and production engineers, optical and QC engineers, tribologists and many other applied scientists should find this book useful. Full Product DetailsAuthor: Tom R Thomas (Avalon Technology, Uk)Publisher: Imperial College Press Imprint: Imperial College Press Edition: 2nd Revised edition Dimensions: Width: 16.50cm , Height: 2.00cm , Length: 22.90cm Weight: 0.522kg ISBN: 9781860941009ISBN 10: 1860941001 Pages: 296 Publication Date: 29 December 1998 Audience: Professional and scholarly , Professional & Vocational Format: Hardback Publisher's Status: Active Availability: Awaiting stock ![]() The supplier is currently out of stock of this item. It will be ordered for you and placed on backorder. Once it does come back in stock, we will ship it out for you. Table of ContentsPart 1 Measurement: stylus instruments; optical techniques; other measurement techniques. Part 2 Characterization: profile characterization; area characterization; rough surfaces as fractals. Part 3 Applications: contact mechanics; tribology; other applications.ReviewsAuthor InformationTab Content 6Author Website:Countries AvailableAll regions |